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Licensed Unlicensed Requires Authentication Published by De Gruyter July 14, 2011

Validation of the Chinese Parental Expectation on Child’s Future Scale

  • Janet T.Y. Leung and Daniel T.L. Shek EMAIL logo

Abstract

Based on the data collected from 125 parents in Hong Kong, the psychometric properties of the original 23-item Chinese Parental Expectation on Child’s Future Scale (CPECF) are examined in this paper. Results showed that the scale had good reliability (internal consistency and test-retest reliability) and convergent validity in the sample. After deletion of six items, a revised scale (Revised-CPECF) was further developed. The Revised Chinese Parental Expectation on Child’s Future Scale (Revised-CPECF) showed improvement in internal consistency and convergent validity. For the dimensionality of the revised measure, a 5-factor structure was extracted from the parent sample. The present study is a pioneer attempt to assess parental expectation on child’s future in different Chinese communities.


Corresponding author: Professor Daniel T.L. Shek, PhD, FHKPS, BBS, JP, Chair Professor of Applied Social Sciences, Faculty of Health and Social Sciences, Department of Applied Social Sciences, The Hong Kong Polytechnic University, Room HJ407, Core H, Hunghom, Hong Kong, P.R. China

Received: 2010-10-12
Accepted: 2010-12-13
Published Online: 2011-07-14
Published in Print: 2011-08-01

©2011 by Walter de Gruyter Berlin Boston

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