Abstract
It is a well known fact that increasing temperature increases noise in all kind of electronics, which applies also to cell and tissue measurements by microelectrode arrays (MEAs). We show that ambient temperature may have a surprisingly big role in the noise level of MEA measurements. To study that we measured the baseline noise when the MEA amplifier was subject to temperature variations, either in a temperature chamber or by preventing amplifier unit’s normal heat exchange. Around room temperature (+24°C) the RMS value of the baseline noise was found to increase approximately 0.14 µV/°C, which is a huge variation as the default RMS noise at that temperature with our setup was only around 5.5 µV. Additional cooling of the MEA amplifier could thus be a clever way to decrease the noise level at very sensitive measurements and on the other hand, one should not interfere the amplifier’s normal heat exchange to the ambient air in order to avoid additional warming and thus increasing the noise level.
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
1. Thomas C, Springer P, Loeb G et al. (1972) A miniature microelectrode array to monitor the bioelectric activity of cultured cells. Exp Cell Res 74:61–66
2. Janders M, Egert U, Stelzle M et al. (1996) Novel thin film titanium nitride micro-electrodes with excellent charge transfer capability for cell stimulation and sensing applications., Proc. of 18th Ann. Intl. Conf. of the IEEE Eng. in Med. and Biol. Soc., Amsterdam, Netherlands, 1996, pp 245–247
3. Ryynänen T, Ylä-Outinen L, Narkilahti S et al. (2012) Atomic layer deposited iridium oxide thin film as microelectrode coating in stem cell applications. J. Vac. Sci. Technol. A 30:1–5
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this paper
Cite this paper
Ryynänen, T., Lekkala, J. (2018). Temperature effect on the baseline noise in MEA measurements. In: Eskola, H., Väisänen, O., Viik, J., Hyttinen, J. (eds) EMBEC & NBC 2017. EMBEC NBC 2017 2017. IFMBE Proceedings, vol 65. Springer, Singapore. https://doi.org/10.1007/978-981-10-5122-7_2
Download citation
DOI: https://doi.org/10.1007/978-981-10-5122-7_2
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-5121-0
Online ISBN: 978-981-10-5122-7
eBook Packages: EngineeringEngineering (R0)